bump version

fix CAS/RAS/WE fault detect on data-huge test
fix data test Fault assignment
fix comment
fix shutdown

Test_Data.c

@@ -67,7 +67,7 @@ RenderTest(	sst1DeviceInfoStruct* devInfo,
 	
 	clearScreen(sstregs,0x00000000,8,2);
 	
-	/* draw a 8x2 rectangle */
+	/* draw a 2x2 rectangle */
 	drawRect(sstregs,0,0,2,2);
 	sst1InitIdle(sst);
 	
@@ -176,7 +176,7 @@ RenderTest(	sst1DeviceInfoStruct* devInfo,
 			WordBitFaultSet(pFaultSrcCtx, ErrorMark_L2, 1.0 / 16, U9_TMU0_FT_DATA_0, U9_TMU0_FT_DATA_0);
 			MemChipDQFaultSet(pFaultSrcCtx, ErrorMark_L2, dScoreFront, U18, U17);
 			MemChipDQFaultSet(pFaultSrcCtx, ErrorMark_L2, dScoreBack,  U25, U26);
-			WordBitFaultSet(pFaultSrcCtx,ErrorMark_L1, 1.0 / 4, U9_TMU0 + 32 + 1, U9_TMU0 + 48 + 1);
+			WordBitFaultSet(pFaultSrcCtx,ErrorMark_L2, 1.0 / 4, U9_TMU0 + 32 + 1, U9_TMU0 + 48 + 1);
 			
 			TMUTexDataCtrlFaultSet(	pFaultSrcCtx, 
 									ErrorMark_L2,

Test_Data_Huge.c

@@ -95,7 +95,7 @@ static const def_sFaultSheet sFaultSheet[MAX_TMU][2] =
 			.Ux_TMUx_TEXDATA_x_0 = U8_TMU1+1+0,
 		},
 		{ /*EVEN row*/
-			.ucNumTMU = 2,
+			.ucNumTMU = 1,
 			.bEvenRow = 1,
 			.Ux_MEMChip_MainMSB = U15,
 			.Ux_MEMChip_MainLSB = U16,
@@ -265,7 +265,7 @@ AssignFault(const def_sFaultSheet* 	psCurFaultSheet,
 								+ bitIdx,
 							1.0/2);
 	
-	if((relbitIdxWord==15) && (nbErrWord>16))
+	if((relbitIdxWord==15) && (nbErrWord>8))
 	{
 		logD("- too many errors on this Word, suspecting CAS/RAS/WE.\n");
 		switch(WordIdx)

V2MemTest.h

@@ -3,7 +3,7 @@
 
 #define V2MEMTEST__VERSION__MAJOR	0
 #define V2MEMTEST__VERSION__MINOR	2
-#define V2MEMTEST__VERSION__PATCH	1
+#define V2MEMTEST__VERSION__PATCH	2
 
 #include <stdbool.h>
 #include <stdlib.h>

main.c

@@ -500,6 +500,9 @@ int main(int argc, char **argv)
 			}
 			logI("\n");
 		}
+
+		sst1InitShutdown(sst);
+		sst = NULL;
 	}
 	
 	FaultSource_getSorted(ar_dFaultScores_sorted,ar_dFaultScores);